Near-field and far-field modeling of scattered surface waves. Application to the apertureless scanning near-field optical microscopy |
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Authors: | J Muller |
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Institution: | LEMTA (Laboratoire d’Energétique et de Mécanique Théorique et Appliquée), Nancy Université, CNRS UMR 7563, Faculté des Sciences et Technologies, BP 70239-54506 Vandœuvre Cedex, France |
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Abstract: | The detection of surface waves through scanning near-field optical microscopy (SNOM) is a promising technique for thermal measurements at very small scales. Recent studies have shown that electromagnetic waves, in the vicinity of a scattering structure such as an atomic force microscopy (AFM) tip, can be scattered from near to far-field and thus detected. In the present work, a model based on the finite difference time domain (FDTD) method and the near-field to far-field (NFTFF) transformation for electromagnetic waves propagation is presented. This model has been validated by studying the electromagnetic field of a dipole in vacuum and close to a dielectric substrate. Then simulations for a tetrahedral tip close to an interface are presented and discussed. |
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Keywords: | FDTD Near-field SNOM |
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