Affiliation: | Instituto de Ciencia de Materiales de Sevilla, Departamento Quimica Inorgänica, CSIC, Universidad de Sevilla, P.O. Box 1115, c/ Professor Garcia González s/n, E-41071, Sevilla, Spain Departamento de Flsica Aplicada C-XII, Universidad Autónoma de Madrid, Cantoblanco, E-28049, Madrid, Spain |
Abstract: | Compositional changes induced by 3.5 keV Ar+ sputtering in TiO2, NiO, NiTiO3 and a (TiO2 + NiO) mixture have been quantitatively studied by XPS. Although all the samples show important changes in their stoichiometry, the extent of the decomposition depends on the compound. The stability of Ti4+ appears to be enhanced by the presence of Nisu2+ cations which, on the other hand, are more easily reduced to Ni0 than in pure NiO. To explain these results a redox solid state reaction between the intermediate phases formed during sputtering is proposed, which tends to preserve the most stable phases. |