Electrical measurements of the electron irradiation induced E- and H-traps in GaAs under hydrostatic pressure

The change of resistivity of the 2.3 MeV-electron-irradiated bulk n- and p-GaAs have been measured at hydrostatic pressure up to 5 kbar at RT. Corrections for the changes in free electron and hole mobilities with pressure have been neglected. The resistivity changes are explained by a dependence on pressure of the ionisation energy of the radiation-induced E- and H-traps. The results indicate that most from these radiation- induced levels moves away from the conduction-band edge (γ_c-point) at a rate approximately (0.8?1.0)γ_G, here γ_G=11.6×10^?6 eV bar^?1 is the energy gap pressure coefficient for GaAs at RT. The high changes in ionization energies of E2 to E5-traps upon pressure are to be compared with the lower changes in ionization energies found for the deep-lying impurity levels. In accordance with the theoretical investigation it was suggested that most of the investigated radiation-induced levels in GaAs are t₂-states of Ga- and As-vacancies.