X-ray diffraction in a crystal with a linear lattice parameter variation

The dynamical X-ray diffraction in a crystal with a linear lattice parameter variation (LLPV) and its applications to the X-ray diffractional investigations of thin solid state films are studied. For the interpretation of the reflection coefficients angular dependence is the Fresnel layers construction developed. Some particular cases of the general diffractional problem solutions for the crystals with LLPV are treated.