Weak-localization correction to the anomalous Hall effect in polycrystalline fe films

In situ transport measurements have been made on ultrathin (<100 A thick) polycrystalline Fe films as a function of temperature and magnetic field for a wide range of disorder strengths. For sheet resistances Rxx less than approximately 3kOmega, we find a logarithmic temperature dependence of the anomalous Hall conductivity sigmaxy, which is shown for the first time to be due to a universal scale dependent weak-localization correction within the skew-scattering model. For higher sheet resistance, granularity becomes important and the break down of universal behavior becomes manifest as the prefactors of the lnT correction term to sigmaxx and sigmaxy decrease at different rates with increasing disorder.