New insights on structural dynamics of electrochemical interface by time-resolved surface X-ray diffraction |
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| Authors: | Masashi Nakamura |
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| Affiliation: | Department of Applied Chemistry and Biotechnology, Graduate School of Engineering, Chiba University, Yayoi-chi 1-33, Inage-ku, Chiba 263-8522, Japan |
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| Abstract: | Many time-resolved measurements of electrochemical interface have been developed in conformity with the time scale of various transition. X-ray diffraction using synchrotron radiation is a powerful tool for structural determination of electrical double layer in real time. This short review describes structural dynamics of interfacial ions during the faraday and non-faraday processes in the time scale from microsecond to second. |
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| Keywords: | Surface X-ray diffraction Electrical double layer Outer Helmholtz plane Time resolved measurement Under potential deposition |
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