Low-frequency surface-enhanced Raman scattering spectroscopy at metal electrode surfaces |
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Authors: | Motoharu Inagaki Kenta Motobayashi Katsuyoshi Ikeda |
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Affiliation: | 1. Department of Physical Science and Engineering, Nagoya Institute of Technology, Gokiso, Showa, Nagoya 466-8555, Japan;2. Frontier Research Institute for Materials Science (FRIMS), Nagoya Institute of Technology, Gokiso, Showa, Nagoya 466-8555, Japan;3. Global Research Center for Environment and Energy Based on Nanomaterials Science (GREEN), National Institute for Materials Science (NIMS), Tsukuba 305-0044, Japan |
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Abstract: | Low-frequency surface-enhanced Raman scattering (SERS) spectroscopy is a versatile tool for studying surface phenomena under electrochemical conditions. This spectroscopy enables us to obtain rich information on extramolecular vibrations between substrate and adsorbates, which are sensitive to atomistic surface features of the substrate. Owing to recent advancements in optical filter technology, low-frequency SERS signals are now becoming easily detectable using conventional Raman systems equipped with holographic notch filters. In addition, SERS background signals, which have been simply ignored, can provide electronic information on the metal substrate. This allows us to observe both sides of electrode–electrolyte interfaces in situ and simultaneously, which is never expected in far-infrared or terahertz absorption spectroscopy. This advanced SERS spectroscopy can help our understanding of electrochemical and electrocatalytic reactions at the molecular scale. |
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Keywords: | Terahertz vibrations Surface-enhanced Raman scattering In situ spectroelectrochemistry Defined metal surfaces |
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