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Measurement of surface form deviation of the plane optical element using grid line method
Authors:Xiaojun Jiang  Huijie Huang  Aijun Zeng
Affiliation:a Shanghai Second Polytechnic University, Shanghai 201209, China
b Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
c Graduate School of the Chinese Academy of Sciences, Beijing 100049, China
Abstract:A method for automatically measuring the surface form deviation of the plane optical element is presented. It uses the image pre-processing technique to obtain the centerlines of the interference fringes, the grid line technique to search the average fringe spacing and the maximum curvature of the interference fringes, and the normalization to obtain the value of surface form deviation of the optical element. The experimental results show that the measuring precision of the surface form deviation of the plane optical element reaches the value of 0.1 and the method improves the adaptation capability of processing the interference fringes, which indicates that the method can substitute the visual interpretation of interference fringes in high-noise workshop environment.
Keywords:Optical test   Surface form deviation   Digital image processing   Fringe analysis
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