Characterization of polarization states of surface plasmon polariton modes by Fourier-plane leakage microscopy |
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| Authors: | S.P. Frisbie A. Krishnan J. Ajimo L. Grave de Peralta |
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| Affiliation: | a Department of Electrical and Computer Engineering, Nano Tech Center, Texas Tech University, Lubbock, TX 79409, USAb Department of Physics, Texas Tech University, Nano Tech Center, Lubbock, TX 79409, USA |
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| Abstract: | We demonstrate that the polarization states of guided wave surface plasmon polariton (SPP) modes can be unambiguously identified by introducing a linear polarizer in the optical path of the light within a leakage-based microscope. We show the use of Fourier-plane leakage-based microscopy as a polarization characterization method to study the polarization states of SPP modes excited in plasmonic waveguides. Our results indicate that the inclusion of a linear polarizer provides additional image processing capabilities to leakage-based microscopes. |
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