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Intensity calibration and sensitivity factors for XPS instruments with monochromatic Ag Lα and Al Kα sources |
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| Authors: | Alexander G Shard Jonathan DP Counsell David J H Cant Emily F Smith Parnia Navabpour Xiaoling Zhang Christopher J Blomfield |
| Institution: | 1. National Physical Laboratory, Chemical and Biological Sciences, Middlesex, UK;2. Kratos Analytical Ltd, Manchester, UK;3. Nanoscale and Microscale Research Centre, School of Chemistry, University of Nottingham, University Park, Nottingham, UK;4. West Stone House, Teer Coatings Ltd, Droitwich, UK |
| Abstract: | |
| Keywords: | HAXPES inelastic background depth profile angle resolved sensitivity factors calibration |