Analyzing and modeling the performance degradation of flash A/D converters due to substrate noise coupling |
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Authors: | Athanasios Stefanou Georges Gielen |
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Institution: | (1) ESAT-MICAS, Katholieke Universiteit Leuven, 3001 Leuven, Belgium |
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Abstract: | This paper presents a model to evaluate the impact of substrate noise on a CMOS regenerative comparator and moreover to predict
the resulting performance degradation of a flash analog-to-digital (A/D) converter. The proposed approach initially relates
substrate noise to the induced timing uncertainty of the comparator by means of an analytical linear model. In particular,
the analysis first focuses on analyzing and expressing the resulting non-uniform sampling distortion in regenerative comparators
in the presence of a deterministic ground bounce. Two sources of distortion are identified and evaluated: the input-dependent
and the substrate noise-dependent one. For each error contributor, the analysis investigates two cases of timing error, based
on the frequency correlation of the interfering signal with the sampling clock. The properties (number and power of distortion
tones) of the sampling error spectrum are found to be highly dependent on the spectral content of the interfering signal and
the sampling clock, while the model captures accurately the induced distortion. Subsequently, the linear model is extended
to estimate the degradation of flash A/D converters and is utilized to predict the performance of practical flash and time-interleaved
converters in the presence of substrate noise. |
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Keywords: | |
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