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Stress analysis of electrostrictive material with an elliptic defect
Authors:Quan?Jiang,Zhenbang?Kuang  author-information"  >  author-information__contact u-icon-before"  >  mailto:zbkuang@mail.sjtu.edu.cn"   title="  zbkuang@mail.sjtu.edu.cn"   itemprop="  email"   data-track="  click"   data-track-action="  Email author"   data-track-label="  "  >Email author
Affiliation:Department of Engineering Mechanics, Shanghai Jiaotong University, Shanghai 200240, China
Abstract:It is shown that the constitutive equation and electric body force used to discuss the stress analysis of electrostrictive material in some previous literature are not appropriate. This paper presents the corrected stress solution for the infinite plane with an insulated elliptic hole under an applied electrical field. The numerical result obtained for the PMN material constants show that the stress near the end of the narrow elliptic hole is the tensile stress.
Keywords:electrostriction   elliptic hole   conformal transformation.
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