二次电子对离子束流品质影响的动态研究

基于粒子云网格的计算方法，建立了具有外电路的加速系统模型，模拟了氘离子束轰击靶面产生二次电子的过程，动态地分析了二次电子的产生对离子加速电压的影响以及对氘离子束束流品质和氘离子束轰击靶面能量的影响。结果表明，当有0.06 A的二次电子电流产生时，离子加速电压将会下降45%，从而导致氘离子束束流品质下降，参与氘氚反应的氘离子数减少，相应的氘离子束轰击靶面的能量下降43.8%。

Dynamic study on effect of secondary electron on ion beam quality

This paper uses the technique of particle-in-cell to build an accelerating section model with external circuit to simulate the electron effect of deuterium ion beam bombarding the target surface and analyze the influence of secondary electrons on acceleration voltage, quality of deuterium ion beam and energy beam bombarding the target dynamically. The results indicate that the acceleration voltage will decrease 45% when there is 0.06 A electron current, which then lead to the deterioration of deuterium ion beam's quality. The energy of beam bombarding the target decrease 43.5%, which will influence the neutron yield.