Investigation of the formation of quasicrystalline Al70-Pd20-Re10 phase in situ during annealing |
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| Authors: | I. A. Makhotkin S. N. Yakunin A. Yu. Seregin D. S. Shaitura M. B. Tsetlin E. Yu. Tereshchenko |
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| Affiliation: | 1.Shubnikov Institute of Crystallography,Russian Academy of Sciences,Moscow,Russia;2.Russian Research Center Kurchatov Institute,Moscow,Russia;3.FOM Institute for Plasma Physics Rijnhuizen,Nieuwegein,The Netherlands |
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| Abstract: | The change in the phase composition of thin-film layered AlPdRe nanostructures during annealing, which led to the formation of a quasicrystalline layer, has been studied in situ. It is shown that the Al3Pd phase is formed at a temperature above 260°C, which transforms into the AlPd phase at 580°C, and the icosahedral quasicrystalline Al-Pd-Re phase is formed at 680°C. |
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