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Growth mechanism and morphology of Ge on Pb covered Si(111) surfaces
Authors:Ing-Shouh Hwang  Tien-Chih Chang  Tien T Tsong  
Institution:

a Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan

b Department of Electrical Engineering, National Taiwan University, Taipei, Taiwan

Abstract:We study the mechanism and surface morphology in epitaxial growth of Ge on Pb covered Si(111) using a scanning tunneling microscope (STM). We find that Ge adatoms have a very large diffusion length at room temperature. The growth is close to perfect layer-by-layer for the first two bilayers. Surface roughness increases gradually with the film thickness, but no 3D islands are found at room temperature. For growth at not, vert, similar200°C, 3D Ge islands appear after completion of the second bilayer. At room temperature, we believe, the Pb layer enhances surface diffusion and the descending-step motion of Ge adatoms, but the ascending-step motion is hindered and thus 3D island growth is suppressed.
Keywords:Diffusion and migration  Epitaxy  Growth  Morphology  Nucleation  Scanning tunneling microscopy  Silicon
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