Preparation and study of microstructures, optical properties and oscillator parameters of titanium (IV) oxide (TiO2) film

In this study, Titanium (IV) Oxide (TiO₂) film has been prepared and characterized by X-ray diffraction (XRD). The XRD pattern of TiO₂ film of anatase phase exhibit very sharp peaks at 25° and 47.85°. According to Scherrer??s formula the grain size of anatase (101) phase TiO₂ nananoparticle is 38.5 nm. The optical properties and constants of TiO₂ film of thickness (4 ??m) have been investigated at room temperature. The transmittance, reflectance and absorbance spectra are measured in the wavelength range (340?C900 nm). Optical constants of TiO₂ film are derived from the transmission spectra and the refractive index dispersion of the film. The oscillator energy, E ₀ dispersion energy, E _d , the static refractive index, n ₀, and other parameters have been determined by the single oscillator Wemple-DiDomenico method. This film can be used in the form of thin film in dye-sensitized solar cells.