| ICP-AES法同时测定铬酸钾中杂质元素 |
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| 引用本文： | 余志辉,齐涛,曲景奎,初景龙,王丽娜.ICP-AES法同时测定铬酸钾中杂质元素[J].光谱学与光谱分析,2009,29(8):2250-2253. |
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| 作者姓名： | 余志辉 齐涛 曲景奎 初景龙 王丽娜 |
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| 作者单位： | 1. 中国科学院过程工程研究所绿色过程与工程重点实验室,北京,100190;中国科学院研究生院,北京,100039
2. 中国科学院过程工程研究所绿色过程与工程重点实验室,北京,100190 |
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| 基金项目： | 国家科技支撑计划，国家重点基础研究发展规划(973计划)，国家自然科学基金，中国化工集团科技基金 |
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| 摘 要： | 应用电感耦合等离子发射光谱法(ICP-AES)同时测定K2CrO4中微量Ca,Mg,Ba,Co,Cd,Cu,Mn,Pb,Sr,Zn,Al,Fe,Ni,Ti,Si,V等杂质元素含量.通过选掸合适的分析谱线,采用基体匹配法消除了样品中基体元素的干扰.结果表明,在选定的测定条件下,方法的标准曲线线性关系良好(R2=0.998 6～1.000),实验测得16种元素的检出限在0.075～2.625 mg·kg-1之间,两次测定的加标回收率在83.7%～113.0%之间,9次测定的RSD小于9.48%.实验表明该方法快速、简便、准确、可靠,可用于实际样品分析.通过对测定结果的分析,得出K2CrO4中含有较高含量的Ca,Mg,Al,Si,不能直接用来作为离子膜法电催化合成铬酸酐的原料,必须对K2CrO4进行进一步的精制.
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| 关 键 词： | 基体匹配 微量元素 电感耦合等离子发射光谱法 |
| 收稿时间： | 2008/6/16 |
Simultaneous Determination of Impurities in K_2CrO_4 by ICP-AES |
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| YU Zhi-hui,QI Tao,QU Jing-kui,CHU Jing-long,WANG Li-na.Simultaneous Determination of Impurities in K_2CrO_4 by ICP-AES[J].Spectroscopy and Spectral Analysis,2009,29(8):2250-2253. |
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| Authors: | YU Zhi-hui QI Tao QU Jing-kui CHU Jing-long WANG Li-na |
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| Institution: | YU Zhi-hui1,2,QI Tao1,QU Jing-kui1,CHU Jing-long1,WANG Li-na11. Key Laboratory of Green Process , Engineering,Institute of Process Engineering,Chinese Academy of Sciences,Beijing100190,China2. Graduate University of Chinese Academy of Sciences,Beijing 100049,China |
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| Abstract: | The trace elements,Ca,Mg,Ba,Co,Cd,Cu,Mn,Pb,Sr,Zn,Al,Fe,Ni,Ti,Si and V,in K2CrO4 were simultaneously determined by inductively coupled plasma atomic emission spectrometry (ICP-AES). Optimum spectral lines were selected for each analyzed element. The matrix effect was studied and eliminated through matrix matching. The results show that the linear correlations of standard curves are good (R2=0.998 6-1.000) under the determined conditions. The recoveries of standard addition are in the range of 83.7%-113.0%,an... |
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| Keywords: | K2CrO4 |
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