Factors affecting coercivity in (Y,Sm,Tm)3(FeGa)5O12 and (Y,Sm,Lu,Ca)3(FeGe)5O12 LPE films |
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Authors: | SG Parker |
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Institution: | Texas Instruments Incorporated, Physical Sciences Research Laboratory Dallas, Texas 75265, USA |
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Abstract: | Factors which influence coercivity, Hc, in (Y,Sm,Lu,Ca)3(FeGe)5O12 films and in (Y,Sm,Tm)3(FeGa)5O12 films grown by LPE have been identified. An anomalous layer at the film-substrate interface exhibits coercivity values different from that of the middle, bulk, portion of the film. The contribution of the transient layer at the substrate interface could be reduced by increasing the rotation rate while immersing the substrate into the melt. Films containing Ga show lower coercivities than films containing CaGe possibly because films with Ga are more uniform in composition. Films with Ga show increased coercivities with increasing growth rates and with increasing Sm content throughout the film. |
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