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ESR of Ni doped amorphous chalcogenide semiconductors
Authors:M Kumeda  T Shimizu
Institution:Department of Electronics, Faculty of Technology, Kanazawa University, Kanazawa 920, Japan
Abstract:ESR signals with g = 2.08 and 2.13 due to Ni were observed for evaporated (Ge0.32Se0.32Te0.32As0.4) 100-xNix and (Ge13Se23 100-xNix films respectively. The large increase of the electrical conductivity by the addition of Ni is discussed in connection with the ESR signal. Bulk glasses prepared by melt-quenching are also investigated for comparison.
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