A Method on Analog Circuit Fault Diagnosis with Tolerance |
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Authors: | Yan-Jun Li Hou-Jun Wang Ruey-Wen Liu |
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Institution: | 1. School of Automation Engineering, University of Electronic Science and Technology of China, Chengdu, 610054, China 2. Department of Electrical Engineering, University of Notre Dame, South Bend, Indiana, USA |
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Abstract: | In this paper, it is proved that the direction of the node-voltage difference vector, which is the difference between the node-voltage vector at faulty state and the one at the nominal state, is determined only by the location of the faulty element in linear analog circuits. Considering that the direction of the node-voltage sensitivity vector is the same as the one of the node-voltage difference vector and also considering that the module of the node-voltage sensitivity vector presents the weight of the parameter of faulty element deviation relative to the voltage difference, fault dictionary is set up based on node-voltage sensitivity vectors. A decision algorithm is proposed concerned with both the location and the parameter difference of the faulty element. Single fault and multi-fault can be diagnosed while the circuit parameters deviate within the tolerance range of 10 %. |
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Keywords: | Analog circuit fault diagnosis fault dictionary node-voltage difference vector sensitivity vector |
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