| Affiliation: | (1) Department of Physics, University of Ulsan, Ulsan, 680-749, Korea;(2) Department of Electrophysics, Kwangwoon University, Seoul, 139-701, Korea;(3) Department of Physics and Astronomy, Northwestern University, Evanston, Illinois 60208, USA |
| Abstract: | We have investigated the structural and thermoelectric properties of (Sb1-xBix)2Te3 thin films on CdTe(111)B. Analysis of X-ray diffraction patterns ( –2 scans and rocking curves) of the films shows that they are of high quality and that they are well aligned with their (00.1) axis normal to the substrates. Measurements of the temperature-dependent thermoelectric power, resistivity, and Hall coefficient of the films were performed with respect to the binary composition, x. For the samples in the range 0.2V/K, the room-temperature carrier concentrations were 3.93–5.13×1019 cm-3, and the room-temperature mobilities were 24.6–64.0 cm2 V-1s-1. PACS 72.20.Pa; 72.80.Jc; 73.6l.Le |
