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High spatial resolution shortwave infrared imaging technology based on time delay and digital accumulation method
Institution:1. Institute of Semiconductor Physics SB RAS, Acad. Lavrent''ev Ave. 13, Novosibirsk 630090, Russia;2. Novosibirsk State University, Pirogov St. 2, Novosibirsk 630090, Russia
Abstract:Shortwave infrared (SWIR) imaging technology attracts more and more attention by its fascinating ability of penetrating haze and smoke. For application of spaceborne remote sensing, spatial resolution of SWIR is lower compared with that of visible light (VIS) wavelength. It is difficult to balance between the spatial resolution and signal to noise ratio (SNR). Some conventional methods, such as enlarging aperture of telescope, image motion compensation, and analog time delay and integration (TDI) technology are used to gain SNR. These techniques bring in higher cost of satellite, complexity of system or other negative factors. In this paper, time delay and digital accumulation (TDDA) method is proposed to achieve higher spatial resolution. The method can enhance the SNR and non-uniformity of system theoretically. A prototype of SWIR imager consists of opto-mechanical, 1024 × 128 InGaAs detector, and electronics is designed and integrated to prove TDDA method. Both of measurements and experimental results indicate TDDA method can promote SNR of system approximated of the square root of accumulative stage. The results exhibit that non-uniformity of system is also improved by this approach to some extent. The experiment results are corresponded with the theoretical analysis. Based on the experiments results, it is proved firstly that the goal of 1 m ground sample distance (GSD) in orbit of 500 km is feasible with the TDDA stage of 30 for SWIR waveband (0.9–1.7 μm).
Keywords:SWIR  TDDA  SNR  High spatial resolution  InGaAs
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