Thulium doped monoclinic KLu(WO4)2 single crystals: growth and spectroscopy |
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| Authors: | O. Silvestre M.C. Pujol M. Rico F. Güell M. Aguiló F. Díaz |
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| Affiliation: | (1) Física i Cristal·lografia de Materials (FiCMA), Universitat Rovira i Virgili, Campus Sescelades, c/Marcellí Domingo, s/n, 43007 Tarragona, Spain;(2) Instituto de Ciencia de Materiales de Madrid, Consejo Superior de Investigaciones Científicas, c/Sor Juana Inés de la Cruz 3, Cantoblanco, 28049 Madrid, Spain |
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| Abstract: | This paper presents the crystal growth and optical characterization of thulium-doped KLu(WO4)2 (KLuW). Thulium-doped KLuW macrodefect-free monoclinic single crystals (a*×b×c≈10×7×15 mm3) were grown by the top seeded solution growth slow cooling method with dopant concentrations of 0.5%, 1%, 3% and 5% atomic in solution. The evolution of unit cell parameters in relation with thulium doping was studied by X-ray powder patterns. Thulium energy levels in the KLuW host were determined by 6 K polarized optical absorption. The Judd–Ofelt parameters determined were Ω2=9.01×10-20 cm2, Ω4=1.36×10-20 cm2 and Ω6=1.43×10-20 cm2. The maximum emission cross section for the 1.9 μm emission, calculated by Füchtbauer–Ladenburg method, is 1.75×10-20 cm2, at 1845 nm with E//Nm. The intensity decay time from the emitting levels 1 G 4 and 3 H 4 levels in relation to the concentration were studied. For the lowest thulium concentration, the measured decay times from 1 G 4 and 3 H 4 emitting levels are 140 μs and 230 μs, respectively. PACS 42.55.Rz; 78.20.-e; 78.55.-m |
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