A two-dimensional diffraction pattern sampling system for determining the optimum parameters of a matched spatial filter |
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Authors: | S. Jutamulia H. Fujii T. Asakura |
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Affiliation: | The authors are at the Research Institute of Applied Electricity, Hokkaido University, Sapporo, Hokkaido 060, Japan |
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Abstract: | The synthesis of a matched spatial filter based on holographic methods requires that the spatial frequency band in which the holographic fringe pattern with the best modulation is formed be tuned to the appropriate weighting at the Fourier transform plane of the spatial frequencies of the input object to be studied. For this purpose both the spectral intensity distribution of an input object at the Fourier transform plane and the intensity distribution of a reference beam at that plane must be accurately known beforehand. A two-dimensional diffraction pattern sampling system has been constructed which enables the Fourier spectral intensity distribution of the input object and the reference beam intensity distribution to be faithfully recorded. A preliminary experimental study shows the usefulness of this system. |
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Keywords: | optics diffraction matched spatial filters |
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