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Surface spectroscopic characterization of advanced polymer materials
Authors:Luigia Sabbatini  Cosimino Malitesta  Gemme Morea  Luise Torsi  Pier G Zambonin
Institution:(1) Analytical Chemistry Laboratory, Chemistry Department, University of Bari, Trav. 200 ReDavid 4, 1-70126 Bari, Italy
Abstract:The potential of a complementary use of X-ray photoelectron spectroscopy and static ToF-SIMS has been exploited with reference to the characterization of electron conducting polymers (polybithiophene) electrochemically synthetized. Particular attention has been focused on the problem of material stability under electrochemical switching.A coherent picture could be drawn showing that irreversible modifications of the surface chemistry occur, strongly dependent on the dryness of the solvent; moreover, the pathway of doping-undoping process can vary noticeably in dependence on the experimental conditions.
Keywords:XPS  ToF-SIMS  conducting polymers  silicon  polybithiophene
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