Surface spectroscopic characterization of advanced polymer materials |
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Authors: | Luigia Sabbatini Cosimino Malitesta Gemme Morea Luise Torsi Pier G Zambonin |
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Institution: | (1) Analytical Chemistry Laboratory, Chemistry Department, University of Bari, Trav. 200 ReDavid 4, 1-70126 Bari, Italy |
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Abstract: | The potential of a complementary use of X-ray photoelectron spectroscopy and static ToF-SIMS has been exploited with reference to the characterization of electron conducting polymers (polybithiophene) electrochemically synthetized. Particular attention has been focused on the problem of material stability under electrochemical switching.A coherent picture could be drawn showing that irreversible modifications of the surface chemistry occur, strongly dependent on the dryness of the solvent; moreover, the pathway of doping-undoping process can vary noticeably in dependence on the experimental conditions. |
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Keywords: | XPS ToF-SIMS conducting polymers silicon polybithiophene |
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