| Abstract: | Both the electron optical image contrast and the electron current density of all crystal grains decrease by plastic deformation of polycrystalline samples in a secondary electron emission microscope with conventional high vacuum. As a presumption both the sample temperature and the vacuum must be so high that the secondary electron yield does not change during the variation of these parameters. After recrystallisation the electron current densities of the crystallites with preserved orientation return to those of the initial stage. From these results it follows that a connection exists between secondary electron yield and crystal lattice perfection. A qualitative explanation of this connection is tried. |
