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Design of a Resonant-Cavity-Enhanced p-i-n GaN/AlxGa1-xN Photodetector
Authors:T Li  J C Carrano  C J Eiting  P A Grudowski  D J H Lambert  H K Kwon  R D Dupuis  J C Campbell  R T Tober
Abstract:A resonant-cavity-enhanced p-i-n photodetector has been designed and analyzed to operate at a wavelength of 360 nm based on the AlxGa1-xN material system. The novel approach has been adopted of using epitaxial AlN/AlxGa1-xN quarter-wave stacks as the distributed Bragg reflector that serves as the front mirror. An AlxGa1-xN absorptive filter layer is incorporated to suppress all but one resonant mode to ensure single, narrow-band operation. This device structure is projected to achieve wavelength selective, high speed, and high quantum efficiency operation in the ultraviolet. MOCVD-grown 6 1/2-pair AlN/AlxGa1-x
Keywords:Ultraviolet  Photodetector  Resonant  Cavity  Iii-V  Nitrides  Bragg  Reflector  Interface  Roughness
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