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On the evolution of the ground state in the system U x La 1 - x S: Polarized neutron diffraction and X-ray magnetic circular dichroism study
Authors:A. Bombardi  N. Kernavanois  P. Dalmas de Réotier  G.H. Lander  J.P. Sanchez  A. Yaouanc  P. Burlet  E. Lelièvre-Berna  A. Rogalev  O. Vogt  K. Mattenberger
Affiliation:Département de Recherche Fondamentale sur la Matière Condensée, Commissariat à l'énergie Atomique-Grenoble, 38054 Grenoble, France, FR
European Commission, Joint Research Centre, Institute for Transuranium Elements, Postfach 2340, 76125 Karlsruhe, Germany, DE
Institut Laue Langevin, 38043 Grenoble, France, FR
European Synchrotron Radiation Facility, 38043 Grenoble, France, FR
Laboratorium für Festk?rperphysik, Eidgen?ssische Technische Hochschule-Zürich, 8093 Zürich, Switzerland, CH
Abstract:In the UxLa1-xS system there is an abrupt loss of the long-range ferromagnetic ordering found in pure US at a critical concentration x c ∼ 0.57, which is far above the percolation limit. As the magnetic ground state in such a system can be strongly affected by small variations of the 5f localization, we have investigated a set of samples with different x by polarized neutron diffraction and X-ray magnetic circular dichroism (XMCD). The neutron results are consistent with early measurements performed on pure US. Even at the lowest U content (x = 0.15, below x c ) the shape of the induced form factor (f ( Q )) is comparable with that found for x = 1 and is well reproduced by either a U4+ or a U3+ state. The ratio between the orbital and the effective spin moments in the XMCD measurements confirms this result, but the evolution of the shape at the M5 edge suggests an abrupt change in the distribution of the electrons (holes) in the 5 f density of states around x c . Received 31 January 2001
Keywords:PACS. 87.64.Ni Optical absorption, magnetic circular dichroism, and fluorescence spectroscopy –   75.25.+z Spin arrangements in magnetically ordered materials (including neutron and spin-polarized electron studies, synchrotron-source X-ray scattering, etc.)
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