聚丙烯孔洞驻极体膜的化学表面处理及电荷稳定性

利用热刺激放电(Thermally Stimulated Discharge, TSD)电流谱、在线电荷TSD、电荷等温衰减测量和衰减全反射(Attenuated Total Reflection, ATR)红外光谱分析，本文系统地研究了经化学表面处理(萃取、氧化及氢氟酸)的聚丙烯(PP)孔洞驻极体膜的电荷储存稳定性及电荷稳定性提高的原因.结果表明：经适当地氧化和氢氟酸室温处理试样的TSD电流谱中在温位约为184℃处出现原膜所没有的非常强的新峰，电荷热稳定性得到显著的提高，这一电荷热稳定性通过高温充电工艺得到进一步地改善；适当延长室温下氢氟酸处理的时间或延长氧化时间，都会使处理膜的电荷稳定性得到提高.理论分析表明在线电荷TSD测量法可给出线性升温过程中电荷重心及驻极体电荷量变化的综合信息，结合TSD电流谱和初始电荷重心位置的测量，可精确地考察线性升温过程中电荷重心的在线变化. 关键词： 聚丙烯孔洞膜 表面氧化 氢氟酸处理 电荷稳定性 在线电荷TSD

Chemical surface treatment and charge stability of polypropylene cellular electret film

The charge stability has been systematically studied by measuring open-circuit thermally stimulated discharge (TSD) current spectra, in situ TSD charge spectra and isothermal charge decay for the polypropylene (PP) cellular films after chemical treatments ( extraction, oxidation and HF solution treatment). The results showed that a very strong new current peak, which the virginal film does not have, appeared at about 184℃ in the TSD current spectrum of the PP cellular film properly oxidized and then HF-treated at room temperature (RT), and that its charge storage thermal stability is significantly improved compared with that of the virginal PP film, and is enhanced further by high temperature charging method. The reason that charge stability of the HF-treated PP films is improved has been clarified by attenuated total reflection infrared (ATR-IR) spectroscopy. The charge stability of treated films can be improved by appropriately prolonging either HF treatment time at RT or oxidation time. The theory of in situ TSD charge indicates that an in situ TSD charge spectrum contains combined information on the changes of the mean charge depth of the deposited charge layer and the deposited charge value. Combining the TSD current spectrum and the initial mean charge depth of a PP cellular film at RT, the change of the mean charge depth can be in situ investigated in heating process.