Method of resonance near-field optical microscopy |
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Authors: | A S Kadochkin |
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Institution: | (1) Ulyanovsk State University, 42 L. Tolstoi St., Ulyanovsk, 432970, Russia |
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Abstract: | We have solved the problem in which a thin metal wafer (probe) with a nanohole interacts with the flat surface of a metastructured
film consisting of metal nanoparticles in an external optical radiation field. Nanoparticles are considered as two-level atomic
systems. This interaction of the wafer-probe and the flat surface in the external optical radiation field gives rise to optical
near-field resonance, the frequency of which differs significantly from the natural frequencies of two-level atoms in the
medium and the probe. The fields inside and outside the probe and metastructured film are calculated in the near-field and
far-field zones. The maximum resolution, which is achievable in the suggested scheme of near-field optical microscopy, can
reach about 10 nm.
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Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 74, No. 4, pp. 499–506, July–August, 2007. |
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Keywords: | near-field optical microscopy near-field resonance nanoparticle |
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