首页 | 本学科首页   官方微博 | 高级检索  
     检索      


Growth study of indium-catalyzed silicon nanowires by plasma enhanced chemical vapor deposition
Authors:I Zardo  S Conesa-Boj  S Estradé  L Yu  F Peiro  P Roca i Cabarrocas  J R Morante  J Arbiol  A Fontcuberta i Morral
Institution:(1) Department of Electrical Engineering and Computer Science and Department of Physics, Massachusetts Institute of Technology, 77 Massachusetts Avenue, 02139 Cambridge, MA, USA;(2) Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, 02139 Cambridge, MA, USA;(3) Department of Chemistry, Massachusetts Institute of Technology, 77 Massachusetts Avenue, 02139 Cambridge, MA, USA;(4) Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, 02139 Cambridge, MA, USA;(5) Department of Electrical Engineering and Computer Science, Massachusetts Institute of Technology, 77 Massachusetts Avenue, 02139 Cambridge, MA, USA;(6) Francis Bitter Magnet Laboratory, Massachusetts Institute of Technology, 77 Massachusetts Avenue, 02139 Cambridge, MA, USA
Abstract:Indium was used as a catalyst for the synthesis of silicon nanowires in a plasma enhanced chemical vapor deposition reactor. In order to foster the catalytic activity of indium, the indium droplets had to be exposed to a hydrogen plasma prior to nanowire growth in a silane plasma. The structure of the nanowires was investigated as a function of the growth conditions by electron microscopy and Raman spectroscopy. The nanowires were found to crystallize along the <111>, <112> or <001> growth direction. When growing on the <112> and <111> directions, they revealed a similar crystal quality and the presence of a high density of twins along the {111} planes. The high density and periodicity of these twins lead to the formation of hexagonal domains inside the cubic structure. The corresponding Raman signature was found to be a peak at 495 cm−1, in agreement with previous studies. Finally, electron energy loss spectroscopy indicates an occasional migration of indium during growth.
Keywords:
本文献已被 SpringerLink 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号