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TEMPERATURE DEPENDENCY OF IMPEDANCE-BASED NONDESTRUCTIVE TESTING
Authors:KK Tseng  ML Tinker  JO Lassiter  DM Peairs
Institution:K.K. Tseng is affiliated with the Department of Civil and Environmental Engineering at Vanderbilt University, Nashville, TN;M.L. Tinker and J. Lassiter are affiliated with Marshall Space Flight Center, National Aeronautics and Space Administration, Hunstville, AL.;D.M. Peairs is affiliated with the Department of Mechanical Engineering at Virginia Tech, Blacksburg, VA.
Abstract:
Keywords:Smart Material  NDT  NDE  Impedance  Piezoceramics  PZT
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