The use of lead isotopic abundances in trace uranium samples for nuclear forensics analysis |
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Authors: | A J Fahey N W M Ritchie D E Newbury J A Small |
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Institution: | (1) Surface and Microanalysis Science Division, Chemical Science and Technology Laboratory, National Institute of Standards and Technology, 100 Bureau Dr. Stop 8371, Gaithersburg, MD 20871-8371, USA |
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Abstract: | Secondary ion mass spectrometry (SIMS), secondary electron microscopy (SEM) and X-ray analysis have been applied to the measurement
of U-bearing particles with the intent of gleaning information concerning their history and/or origin. The lead isotopic abundances
are definitive indicators that U-bearing particles have come from an ore-body, even if they have undergone chemical processing.
SEM images and X-ray analysis can add further information to the study that may allude to the extent of chemical processing.
The presence of “common” lead that does not exhibit a radiogenic signature is clear evidence of anthropogenic origin. |
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