|
|||||
|
|
Analysis of electron diffraction in a novel field-effect transistor |
|
| Authors: | A.M. Kriman G.H. Bernstein B.S. Haukness D.K. Ferry |
| Abstract: | |
| Keywords: | |
| 本文献已被 ScienceDirect 等数据库收录！ | |
|
||||||||||||||||
|
||||||||||||||||
|
||||||||||||||||
|
|
|
|
| 设为首页 | 免责声明 | 关于勤云 | 加入收藏 |
|
Copyright©北京勤云科技发展有限公司 京ICP备09084417号 |