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X-ray studies on layer structure and bistability in ferroelectric liquid crystals
Authors:M. Oh-e   M. Isogai  T. Kitamura
Affiliation: a Hitachi Research Laboratory, Hitachi, Ltd, Ibaraki-ken, Japan
Abstract:X-ray diffraction measurements of thin chiral smectic C (Sc*) liquid crystals between solid plates coated with rubbed polymer film were performed under an electric field. A variety of local layer structures which depend upon the boundary conditions could be observed, including bookshelf and chevron, and some distorted structures. Moreover, the method of layer deformation could be seen in a stepwise induced field, and seven deformation types could be detected. The relation between a bistability effect and the type of layer deformation was clarified and four deformation types were found favourable to bistability. A vertical layer structure at the boundary, like the bookshelf structure, was necessary to produce bistability. A high pretilt film seemed to have a smectic layer reform a tilted structure even under an induced field and it was difficult to produce bistability with the high pretilt one.
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