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Precise Measurement of the Optical Characteristics of the Subsurface Layer of Solids |
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| Authors: | Fedyukhin L. A. Gorchakov A. V. Korobeishchikov N. G. Nikolaev I. V. |
| Affiliation: | 1.Rzhanov Institute of Semiconductor Physics, Siberian Branch, Russian Academy of Sciences, 630090, Novosibirsk, Russia ;2.Novosibirsk State University, 630090, Novosibirsk, Russia ; |
| Abstract: | JETP Letters - A measurement method and a calculation algorithm based on the three-layer structure model have been proposed for the refractive index of optical materials. The method has been... |
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