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High Resolution Investigation on the NiAu Ohmic Contact to p-AlGaN|GaN Heterostructure |
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| Authors: | Zheng-Fei Hu Li Xiang-Yang Zhang Yan |
| Affiliation: | 1.School of Materials Science and Engineering, Tongji University, Shanghai, China ;2.Key Laboratory of Infrared Imaging Materials and Detectors, Shanghai Institute of Technical Physics,Chinese Academy of Sciences, Shanghai, China ; |
| Abstract: | Physics of the Solid State - The low-resistance ohmic contact NiAu|p-type AlGaN|GaN was carefully investigated by high resolution electron microscope (HRTEM) and X-ray photoelectron spectroscopy... |
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