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Dielectric Spectroscopy as a Method for Testing Thin Vanadium Dioxide Films |
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| Authors: | Il’inskii A. V. Kastro R. A. Pashkevich M. E. Shadrin E. B. |
| Affiliation: | 1.Ioffe Institute, 194021, St. Petersburg, Russia ;2.Herzen State Pedagogical University of Russia, 191186, St. Petersburg, Russia ;3.Peter the Great St. Petersburg Polytechnic University, 195251, St. Petersburg, Russia ; |
| Abstract: | Technical Physics - We have analyzed the dielectric spectra of thin (1200 Å) films of vanadium dioxide, a material with strong electron–electron correlations. We have tested both undoped... |
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