X-ray intensity distribution in the image plane of elliptic multilayer mirrors |
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| Authors: | A. D. Akhsakhalyan V. A. Murav’ev N. N. Salashchenko |
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| Affiliation: | (1) Institute for Physics of Microstructures, Russian Academy of Sciences, Nizhni Novgorod, 603950, Russia |
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| Abstract: | The x-ray intensity distribution in the image plane of a multilayer elliptical cylinder and ellipsoid-revolution mirrors was studied Analytical expressions for calculating this distribution were derived as a function of the size of the source, its position with respect to the mirror, and the microroughness of the multilayer structure. |
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