| Researches of DC—Problem Under the Model S in which the Numbers of Defective Coins are not Fixed |
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| 引用本文： | 丁承杰,刘文安.Researches of DC—Problem Under the Model S in which the Numbers of Defective Coins are not Fixed[J].数学季刊,1992,7(4):106-110. |
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| 作者姓名： | 丁承杰 刘文安 |
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| 作者单位： | Henan Normal University，Henan Normal University Xinxiang 453002，Xinxiang 453002 |
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| 摘 要： | In this paper,we research general Defective Cion Problem under the model S,i.e,the number d of Defective cions is not fixed. For d=O,1,or 2. we get some good results.
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| 关 键 词： | 缺陷硬币问题 S模型 试验集 优化试验模式 |
Researches of DC-Problem Under the Model S in which the Numbers of Defective Coins are not Fixed |
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| Ding Chenjie Liu Wenan.Researches of DC-Problem Under the Model S in which the Numbers of Defective Coins are not Fixed[J].Chinese Quarterly Journal of Mathematics,1992,7(4):106-110. |
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| Authors: | Ding Chenjie Liu Wenan |
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| Institution: | HenanNormalUniversity,Xinxiang453002 |
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| Abstract: | In this paper,we research general Defective Cion Problem under the model S,i.e,the number d of Defective cions is not fixed.For d=0,1,or 2.we get some good results. |
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| Keywords: | model S test set optimal test scheme |
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