Improved Uncertainty of Optical Frequency Domain Reflectometry Based Length Measurement by Linearizing the Frequency Chirping of a Laser Diode |
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Authors: | Email author" target="_blank">Seiichi?KakumaEmail author Kohhei?Ohmura Ryoji?Ohba |
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Institution: | (1) Division of Applied Physics, Graduate School of Engineering, Hokkaido University, Kita-13, Nishi-8, Kita-ku, Sapporo 060-8628, Japan |
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Abstract: | Length resolution of optical-frequency-domain-reflectometry (OFDR) is improved by reducing the chirping fluctuation of a laser diode. The fluctuation is detected as the frequency deviation of a beat signal from a reference interferometer, which is used as the control signal for servo-control of the laser diode (LD) drive current. As a result of the effective chirping stabilization, chirping span limited-resolution is achieved. In addition, use of a block gauge as the path difference of the reference interferometer enables the OFDR system to improve accuracy of the length as well as the resolution. |
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Keywords: | optical frequency domain reflectometry block gauge laser diode length measurement |
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