The possibility of using a semiconductor thermal probe to investigate the power flow distribution in waveguides

Conclusions

1. The temperature profile of an absorbing film for a given microwave power flux distribution has been considered.
2. The conditions under which agreement is found between the temperature relief and the flux distribution has been clarified.
3. An experimental investigation has been carried out of the temperature profile in a matched film for the TE₁₀ mode.
4. The possibility of using a semiconductor thermal probe to investigate the microwave power flux distribution has been demonstrated.