Structure of Ultrathin Polycrystalline Iron Films Grown on SiO2/Si(001) |
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Authors: | V. V. Balashev V. V. Korobtsov |
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Affiliation: | 1.Institute of Automation and Control Processes, Far-East Branch,Russian Academy of Sciences,Vladivostok,Russia;2.School of Natural Sciences,Far Eastern Federal University,Vladivostok,Russia |
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Abstract: | The structure of polycrystalline Fe films grown on an oxidized Si(001) surface at room temperature has been studied by the technique of high-energy electron diffraction. It has been found that the grain orientation in the films depends of the amount of deposited iron. In Fe films less than 5 nm thick, grains have been found to be randomly oriented. Fe films more than 5 nm in thickness exhibit the (111) texture with an axis coinciding with the surface normal. The angular dispersion of the [111] direction in the Fe lattice from the surface normal is ±25°. It has been found that as the Fe films become thicker, the (111) texture changes to the (110) texture. |
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