Millimeter and submillimeter wave measurements of complex optical and dielectric parameters of materials |
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Authors: | M. N. Afsar and Kenneth J. Button |
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Affiliation: | (1) Massachusetts Institute of Technology, Francis Bitter National Magnet Laboratory, 02139 Cambridge, MA |
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Abstract: | These low loss materials were chosen for the first in this series of measurements of the complex parameters over the entire millimeter and submillimeter wavelength range of the spectrum. A modular, polarizing, dispersive Fourier transform spectrometer capable of operating over the range 5 mm to 0.004 mm was used to provide a continuous spectrum of the refractive index and absorption coefficient to an accuracy of five decimal places and less than 1 percent, respectively.Partially supported by the U.S. Army Research Office under Contract Number DAAG-29-81-K-0009 and the Office of Fusion Energy, U.S. Department of Energy, under Contract W-7405-eng-26 with Union Carbide Corporation.Supported by the National Science Foundation. |
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Keywords: | millimeter wave materials dielectric parameters absorption coefficient refractive index loss tangent ceramics glass |
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