New materials for sputtered strain gauges |
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Authors: | U. Heckmann R. Bandorf H. Gerdes M. Lübke S. Schnabel G. Bräuer |
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Affiliation: | Fraunhofer Institute for Surface Engineering and Thin Films, Bienroder Weg 54 E, 38108 Braunschweig, Germany;EPFL-IMT, Switzerland;EPFL-IMT, Switzerland |
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Abstract: | Commercial strain gauges obtain a gauge factor of approximately 2 with a compensated temperature coefficient of resistivity (TCR). Therefore, material development for sputtered thin films with a high gauge factor and negligible TCR was conducted. The object for self compensated sensor materials is the combination of a semiconducting material (negative TCR) with high gauge factor and a metal (positive TCR) leading to a TCR close to zero. With nickel containing diamond-like carbon films (Ni-DLC or a-C:H:Ni) and Ag-ITO compounds zero crossing in TCR and gauge factors higher than 10 were achieved. |
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