首页 | 本学科首页   官方微博 | 高级检索  
     


New materials for sputtered strain gauges
Authors:U. Heckmann  R. Bandorf  H. Gerdes  M. Lübke  S. Schnabel  G. Bräuer
Affiliation:Fraunhofer Institute for Surface Engineering and Thin Films, Bienroder Weg 54 E, 38108 Braunschweig, Germany;EPFL-IMT, Switzerland;EPFL-IMT, Switzerland
Abstract:Commercial strain gauges obtain a gauge factor of approximately 2 with a compensated temperature coefficient of resistivity (TCR). Therefore, material development for sputtered thin films with a high gauge factor and negligible TCR was conducted. The object for self compensated sensor materials is the combination of a semiconducting material (negative TCR) with high gauge factor and a metal (positive TCR) leading to a TCR close to zero. With nickel containing diamond-like carbon films (Ni-DLC or a-C:H:Ni) and Ag-ITO compounds zero crossing in TCR and gauge factors higher than 10 were achieved.
Keywords:
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号