High mass and spatial resolution mass spectrometry imaging of Nicolas Poussin painting cross section by cluster TOF‐SIMS |
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| Authors: | Elsa Van Elslande David Touboul Helen Glanville Spike Bucklow Philippe Walter Alain Brunelle |
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| Affiliation: | 1. Laboratoire d'Archéologie Moléculaire et Structurale (LAMS), Sorbonne Universités, UPMC Univ Paris 06, CNRS, UMR 8220, Paris, France;2. Institut de Chimie des Substances Naturelles, CNRS UPR 2301, Univ. Paris‐Sud, Université Paris‐Saclay, Gif‐sur‐Yvette, France;3. Hamilton Kerr Institute, University of Cambridge, Cambridge, UK |
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| Abstract: | Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) imaging using cluster primary ion beams is used for the identification of the pigments in the painting of Rebecca and Eliezer at the Well by Nicolas Poussin. The combination of the high mass resolution of the technique with a sub‐micrometer spatial resolution offered by a delayed extraction of the secondary ions, together with the possibility to simultaneously identifying both minerals and organics, has proved to be the method of choice for the study of the stratigraphy of a paint cross section. The chemical compositions of small grains are shown with the help of a thorough processing of the data, with images of specific ions, mass spectra extracted from small regions of interest, and profiles drawn along the different painting layers. Copyright © 2016 John Wiley & Sons, Ltd. |
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| Keywords: | TOF‐SIMS imaging pigments organic matters (oils and proteins) cultural heritage Nicolas Poussin |
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