Determination of nonlinear absorption and refraction by single Z-scan method |
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| Authors: | M. Yin H.P. Li S.H. Tang W. Ji |
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| Affiliation: | (1) Department of Physics, National University of Singapore, Singapore 119260 (Fax: +65/777-6126, E-mail: scip7193@nus.edu.sg), SG;(2) Photonics Laboratory, School of EEE, Nanyang Technological University, Singapore 639789, SG |
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| Abstract: | We report a simplified Z-scan technique based on a study on the symmetric features of a typical Z-scan curve. The contributions from the two-photon absorption (TPA) and the nonlinear refraction (NLR) are easily separated from a closed-aperture Z-scan curve using this method. And the determination of the two nonlinearities is simplified and unambiguous. We demonstrate this method on ZnSe, CdS, and ZnTe semiconductors with 120-fs laser pulses. And the influence from the uncertainty of the focal plane (Z=0) position is discussed. It is also found that the TPA coefficient can be obtained independently without knowing the exact location of the focal point. Received: 8 July 1999 / Published online: 3 November 1999 |
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| Keywords: | PACS: 42.65.An 78.20.Ci 78.40.Fy |
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