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Study of the polymer surfaces with improved resolution FRES |
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| Authors: | M. H. Rafailovich J. Sokolov X. Zhao R. A. L. Jones E. J. Kramer |
| Affiliation: | (1) Department of Physics, Queens College, 11367 Flushing, NY, USA;(2) Department of Materials Science and Engineering, and Materials Science Center, Cornell University, 14853 Ithaca, NY, USA |
| Abstract: | We have developed a time-of-flight detector system which improves the resolution of standard He+ forward recoil spectrometry (FRES) to better than 300 Å. The technique was used to determine the shape of the concentration profile at the surface of polymer blends of deuterated polystyrene (d-PS) and protonated polystyrene (PS). The results are discussed in terms of the predictions of mean field theories. |
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