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A method to evaluate error correction ability of computer controlled optical surfacing process
Authors:Jia Wang  Bin Fan  Yongjian Wan  Chunyan Shi  Bin Zhuo
Institution:1. Institute of Optics and Electronics, Chinese Academy of Sciences, Chengdu, 610209, China
2. University of Chinese Academy of Sciences, Beijing, 100039, China
3. State Key Laboratory of Optical Technology for Microfabrication, Chengdu, 610209, China
Abstract:Quantitatively investigating error correction ability in frequency domain is important for computer controlled optical surfacing (CCOS) process to correct different spatial frequency errors. Based on the mathematical model coherence between filtering and material removal process of CCOS, a method is proposed to quantitatively evaluate the correction ability of CCOS process. A generalized model named normalized smoothing spectral function (SSF) will be established combine convolution model of CCOS and power spectral density (PSD) function. A set of polishing experiments are performed to calculate SSF curves and validate SSF model. By comparing the results of SSF curve with PSD curve and surface figure, it reveals that SSF curve can quantitatively indicate the correction ability of CCOS process for different spatial frequency errors.
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