Method of envelopes for studying a two-film system on a reflecting substrate |
| |
Authors: | V V Filippov |
| |
Institution: | (1) Stepanov Institute of Physics, National Academy of Sciences of Belarus, Minsk, 220072, Belarus |
| |
Abstract: | For determining the optical constants and the thickness of thin films (including strongly absorbing films) by the spectrophotometric method, we propose to deposit them on intermediate films formed on strongly reflecting substrates. Due to this, an interference pattern depending on the optical constants and the thickness of the film under study will be observed in the reflectance spectrum. The method of envelopes of the extrema in the reflectance spectrum that is based on the iterative approach is developed for studying two-film systems. |
| |
Keywords: | |
本文献已被 SpringerLink 等数据库收录! |
|